Anne Fallon

Thin coatings consisting of materials such as gold or platinum that were applied via sputter coating do not always have the “metallic appearance” we are familiar with in everyday life. Gold or platinum coatings with layer thicknesses below 15 to 20 nm do not have the “gold appearance” or “platinum appearance” that one would expect. This is often interpreted by...

Outline of Optical amplifier measurementWith the increase in communication traffic, the importance of optical amplifiers such as EDFAs (erbium-doped fiber amplifiers) that can directly amplify optical signals without converting them into electrical signals has been widely deployed in traditional backbone optical transmission networks. This proven amplification technique has expanded to a next generation application to boost free space communication laser...

Overview of Pulsed Light Measurement Why use pulsed light? A semiconductor laser emits light by a driving current. This drive current causes the semiconductor laser chip to generate heat, causing a shift in the output wavelength and potentially damaging the laser. To avoid such problems, pulse-driven light emission is widely used. Furthermore, high-power industrial lasers may require an energy accumulation...

Optical transceivers are one of the indispensable key devices for optical communications that interconvert optical and electrical signals. There are various types of optical transceivers: SFP, QSFP, 200GbE, 400GbE, and other network standards. In recent years, optical transceivers have become increasingly high-power to extend communication distance. To accomplish this, the laser in an optical transceiver must have a longer cavity length to achieve high power capability, which causes side mode wavelengths close to the main signal. This increases the need for high resolution/high dynamic range in SMSR  (Side Mode Suppression Ratio) measurements. The AQ6380, which offers high resolution and wide dynamic range, is the perfect solution for SMSR measurements of  O-band lasers for 400GbE QSFP-DD optical transceivers. Reasons why engineers choose the AQ6380 monochromator OSA: 5 pm...

 Zygo, a global leader in precision metrology and optical solutions, has announced the launch and availability of its groundbreaking 0.5X ZWF (Zygo Wide Field) Objective— the widest field-of-view (FOV) interferometric objective commercially available. Engineered for high-speed, high-precision measurement applications, the 0.5X ZWF Objective is set to redefine efficiency and accuracy in industries such as semiconductor, precision machining, and photonics. Invented...

Tuesday, July 15, 18.00 BST Backscatter electron image (top) of a 7 mm Ti-6Al-4V cross-section sample; electron backscatter diffraction (EBSD) map (bottom) collected over the same surface showing full-area crystallographic orientation inverse pole figure map. Modern materials analysis demands sample preparation tools that can keep up with the size, complexity, and sensitivity of engineering materials used in aerospace, semiconductors, and lithium-ion...

24-25 September 2025 Excel, London FREE to attend - The premier event uniting the entire value chains across the microelectronics, semiconductor, photonics and embedded systems industries, uniquely showcasing the UK’s world-class expertise in R&D, design innovation and advanced manufacturing. Email [email protected] or call on 01582 764334 if you would like to arrange a meeting.

Oscilloscopes are essential tools for engineers, technicians, and researchers working with electronic signals. Choosing the right oscilloscope and understanding its technical specifications can significantly impact measurement accuracy and efficiency. This FAQ addresses some of the most important aspects of oscilloscope performance and application. General QuestionsWhat is an oscilloscope?An oscilloscope is an electronic test instrument used for observing the precise shape...

Plan view TEM specimens from a fully fabricated spin-transfer torque magnetic random-access memory (STT-MRAM) device were prepared using a Ga FIB system. Post-FIB concentrated Ar ion beam milling using the Model 1080 PicoMill® TEM specimen preparation system of these plan view TEM specimens allowed controlled thinning and produced artifact-free TEM specimens. FIB plan view specimen preparation followed by concentrated Ar...

Join us for a webinar where we introduce an advanced Ar ion milling technique designed to make your work easier, faster, and more accurate. Click here to view a recording of the event. Traditional Ga focused ion beam (FIB) and Xe plasma FIB milling often cause amorphization and leave ion-implanted layers on TEM specimens. Fischione Instruments’ NanoMill® TEM specimen preparation system has...