Tuesday, July 15, 18.00 BST

Backscatter electron image (top) of a 7 mm Ti-6Al-4V cross-section sample; electron backscatter diffraction (EBSD) map (bottom) collected over the same surface showing full-area crystallographic orientation inverse pole figure map.

Modern materials analysis demands sample preparation tools that can keep up with the size, complexity, and sensitivity of engineering materials used in aerospace, semiconductors, and lithium-ion batteries.

This webinar presents the Model 1062 TrionMill, a tabletop Ar ion milling system designed specifically for large-area sample preparation. With its three independently controlled argon ion sources and flexible beam positioning, the TrionMill delivers unmatched versatility in preparing both:

  • Planar surfaces up to 50 mm in diameter, supporting large-scale surface analysis of coatings, layered structures, and battery electrodes.
  • Cross-sectional areas up to 7 mm wide, enabling high-resolution electron backscatter diffraction (EBSD) and scanning electron microscopy (SEM) characterisation of real-world components, welds, and multiphase materials.

Whether you are performing grain structure analysis in metal-based alloys, strain mapping in advanced semiconductor packages, or developing Li-ion batteries, the TrionMill provides a reliable, damage-free preparation method for accurate and reproducible results

Join Senior Applications Scientist Pawel Nowakowski who will discuss how the TrionMill empowers engineers and scientists to prepare and analyse large-scale SEM industrial samples and achieve precise and repeatable results.

Contact us on 01582 764334 to speak with one of our Product Specialists.

Lambda Photometrics is the leading UK Distributor of Characterisation, Measurement and Analysis solutions with particular expertise in Instrumentation, Laser & Light based products, Optics, Electro-optic Testing, Spectroscopy, Machine Vision, Optical Metrology, Fibre Optics, Microscopy and Anti-vibration tables & custom solutions

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