GoGo Instruments ECH600S Electrical Heating and Cooling Stage JS

The GoGo Instruments ECH600S is a precision electrical heating and cooling stage designed for temperature-dependent electrical characterisation of advanced materials, semiconductor devices, thin films, and electronic components. Combining liquid nitrogen cooling with resistive heating technology, the platform delivers stable thermal control from −190 °C to +600 °C while supporting low-noise electrical measurements and in-situ optical observation.

Built on a compact optical-stage architecture, the ECH600S integrates precision electrical probing, programmable temperature control, and reflection/transmission optical compatibility within a lightweight, low-profile platform suitable for microscopy and spectroscopy integration.

Key Features

• Wide temperature range: −190 °C to +600 °C
• Temperature stability of ±0.1 °C
• Liquid nitrogen cooling with resistive heating
• Heating rates up to 150 °C/min
• Cooling rates up to 40 °C/min
• Reflection and transmission optical modes
• Four magnetic probe holders with gold-plated probes
• Screw-top chamber design for rapid sample access
• Optional vacuum chamber upgrade
• Professional programmable temperature control software
• LabVIEW and C# SDK support for automation
• Compact low-profile stage for microscope integration
• Custom configurations available

Optical Access and Stage Design
The ECH600 supports both reflected-light and transmitted-light experimental configurations, enabling combined electrical and optical analysis. The compact low-profile design enables integration with optical microscopes, spectroscopy systems, and customised in-situ measurement platforms.

Vacuum-Compatible Configuration
The standard ECH600S operates under atmospheric conditions, with optional upgrade paths for vacuum chamber integration.

Compact Microscope-Compatible Design
The low-profile form factor enables integration with many optical platforms. The screw-top chamber simplifies sample exchange and experimental setup while maintaining thermal performance and optical accessibility.

Applications

• Semiconductor reliability testing
• Cryogenic electrical analysis
• Variable-temperature conductivity measurements
• Thin-film transport studies
• Quantum material research
• Dielectric spectroscopy
• Optoelectronic characterisation
• In-situ microscopy with electrical biasing
• Temperature-dependent device testing