GoGo Instruments ECH400V-EB Externally Adjustable Probe Station JS
- Temperature range: -190°C~400°C
- Temperature stability: ±0.1°C
- Vacuum Chamber
- XYZ Travel: ±6mm
- High-Precision Temperature Control
- Professional Temperature Control Software
- Customisation available
The GoGo Instruments ECH400V-EB is an externally adjustable probe station designed for temperature-dependent electrical characterisation of advanced materials and semiconductor devices. Combining precise thermal control with high-stability probe positioning, the system enables reliable in-situ electrical measurements across extreme temperature conditions.
Key Features
- Temperature range from -190°C to 400°C.
- Temperature stability of ±0.1°C.
- Externally adjustable probe positioning system.
- XYZ probe travel of ±6 mm.
- Vacuum-compatible chamber design.
- High-precision thermal control for repeatable measurements.
- Professional temperature control software included.
- Customisation options available for specialised research requirements.
Integrated Thermal and Probe Control
The ECH400V-EB combines advanced thermal management with precision probe manipulation to support complex in-situ experiments. The system supports liquid nitrogen cooling and resistive heating, enabling controlled transitions across cryogenic and elevated temperature conditions.
Applications
The ECH400V-EB is suitable for a wide range of scientific and industrial research applications, including:
- Semiconductor device testing
- Temperature-dependent electrical measurements
- Dielectric material analysis
- Thin-film characterisation
- Quantum material research
- Low-temperature electrical probing
- Nanomaterials and advanced materials research
- In-situ microscopy and spectroscopy studies
|
TYPE |
ECH400V-EB |
|
Cooling/Heating Method |
Liquid nitrogen cooling,Resistance heating |
|
Temperature Range |
﹣190℃~400℃ |
|
Temperature Stability |
±0.1℃ |
|
Heating/Cooling Rate |
Maximum Heating Rate：150℃/min,Maximum Cooling Rate：40℃/min |
|
Sample Holder |
Silver ；23mm*23mm |
|
Optical Path |
Reflection |
|
Top Window Size |
φ25mm*1mm |
|
Window Material |
JGS2 Fused Silica Glass (Transmission Range: 220 nm - 2500 nm), manually removable and replaceable. |
|
Distance from Window Upper Surface to Sample Holder Upper Surface |
16.5mm |
|
Chamber Height |
15mm |
|
Probe |
Gold-Plated Tungsten Carbide Coaxial Probes*4 |
|
Probe Adjustment |
XYZ Travel: ±6mm |
|
Probe Port |
Triaxial BNC*4 |
|
Sample Stage Potential |
Grounded / Electrically Floating |
|
Chamber |
Vacuum |
|
Dimensions |
430mm*430mm*60mm |
|
Net Weight |
10.5kg |
|
Basic Configuration |
GoGo TCS、Externally Adjustable Probe Station*1、 Temperature controller*1、Cooling controller*1、Liquid Nitrogen Tank*1、Recirculating Chiller*1、Cables、Tubing、and Accessories |
|
Optional |
Adapter Plate/Customised Liquid Nitrogen Tank/Customised Recirculating Chiller/Vacuum System/Customised Probe/Customised Probe Port/Computer Host/ Customised Temperature Control Software |
Filters:
Channels: 4
Minimum Temperature: -190
Maximum Temperature: 400
Sample Size: 23mm x 23mm
