Knowledge Base

The new version of PhotonSoft program features advanced capability to conduct group measurements of single and multiple substrates. Such function is of great value when determination of optimum angle of incidence for maximum optical performance is required. Example 1: Thin film polariser The thin film polarisers are often used to separate polarisation of incoming beam, e.g. laser beam. For appropriate...

Whilst working alongside machine vision system integrators, supporting end users and specifying systems for industrial applications the first question asked is ‘Do you really need a colour image?’ Why? Storing and handling data is a challenge and often a fight when working with inspection systems that need to run 24/7. If you can work in mono than we strongly encourage...

During the last few years diode lasers have replaced the Helium-Neon laser in many mass applications (e.g., barcode scanner, marking, adjusting, aligning). The global reduction in Helium-Neon laser sales means a great challenge for the few remaining manufacturers. Whereas, on the one hand, niche products require a resourceful mind to ensure the continuity of raw material supplies, on the other...

  The new version of PhotonSoft program features advanced capability to conduct group measurements of single and multiple substrates. Such function is of great value when determination of optimum angle of incidence for maximum optical performance is required. Measurement of a polariser using a sequence of 5 consecutive measurements of transmittance and reflectance. All of them are shown within one...

Optical profilers are interference microscopes, and are used to measure height variations – such as surface roughness – on surfaces with great precision using the wavelength of light as the ruler. Optical interference profiling is a well-established method of obtaining accurate surface measurements. Optical profiling uses the wave properties of light to compare the optical path difference between a test surface and a reference surface...

ZYGO's Verifire™ Series of laser Fizeau interferometers represent a complete line of high performance metrology instruments for the measurement of plano, spherical and aspherical surfaces and material characteristics. The systems provide a variety of proprietary acquisition techniques to ensure optimum metrology in a wide range of environments. For acquisition in turbulent environments, ZYGO offers the DynaFiz interferometer. While all Verifire™ models can...

Researchers at Imperial College and Rolls-Royce have investigated the nature of blue corrosion areas in Ti alloys used in aerospace applications. After extensive investigation using Light Optical Microscopy (LOM) and Secondary Electron Imaging (SEI) they were able to identify the same blue area with both techniques. The LOM shows the area well but gives no surface topography, whereas because the...

Lock-in amplifiers are used to detect and measure very small AC signals, all the way down to a few nanovolts. Accurate measurements may be made even when the small signal is obscured by noise sources many thousands of times larger. Lock-in amplifiers use a technique known as phase-sensitive detection to single out the component of the signal at a specific...

LN Modulator is a device which converts information to signals by varying intensity and frequency of light. Capacity of transmission signal can be many tens times greater than conventional capacity by using this optical modulator. Application Note for LN Modulators  

Most users who venture into the world of high-speed cameras have already tried capturing video with a home camcorder and observed that they cannot see the necessary details of the event under study because of motion blur or because the event was missed entirely. In many cases, the shutter speed and frame-rate can be determined fairly quickly by trial and...