Lambda holds a significant inventory of demonstration equipment. The Optics Metrology group is no exception as it has Zygo Fizeau Interferometer, a Zygo Optical Profiler and a Savvy Optics Scratch/Dig inspector. In addition to these we will have the Essent Optics UV/VIS/MWIR Spectrophotometer for Optical Coaters on show at PHOTONEX again this year.
Zygo VeriFire QPZ Laser Interferometer
Lambda’s demonstration 4” QPZ offers a bit more to users over the standard workhorse VeriFire XPZ system. Top of the list is the QPSI acquisition capability which allows the QPZ to acquire measurements in moderate vibration environments such as production floor metrology systems. This combined with a 1k x 1k camera and high power, long life stabilised He/Ne laser make for a production friendly tool. Add in the new Mx Software with many intuitive measurements set-up configurations and reporting as well as the familiar and simple QFAS (Quick Fringe Acquisition System) and you have a very useful measurement system.
We also have a range of accessories to work with our 4” QPZ including Transmission Flats (4% and DynaFlect), 2 Axis Mount, f/0.75 Transmission Spheres, 5 axis Mount and Reference Spheres.
Zygo Nexview 3D Optical Surface Profiler
The Nexview is the Zygo flagship optical profiler sporting all you should need to measure most surfaces with light microscopy lateral resolution. The Nexview can measure surfaces from super-smooth to very rough, with sub-nanometer precision that is independent of field of view.
Measure:
Savvy Optics SavvyInspector SIF-4
We have the SIF-4 system at Lambda. The SavvyInspector performs an objective measurement of scratch and dig visibility.
The instrument is designed specifically to reproduce the conditions of an in-reflection visual inspection described in Appendix C of MIL-PRF-13830B, “General specification governing the manufacture, assembly, and inspection of optical components for fire control instruments.”
The SavvyInspector™ SIF-4 uses a 0.5 megapixel camera for standard surface imperfection measurements on flat optics such as windows, filters, mirrors, gratings, and prisms. ISO mode is supported to a grade 0.063 or larger for general and coating imperfections (but not L-type imperfections).
A higher resolution system is available and there is also a new motorised system which has just been released. Fully automated systems may be possible for large volume applications.
Essent Optics PHOTON RT UV-VIS-MWIR Spectrophotometers
We will have a PHOTON RT Spectrophotometer with 190-4900 nm wavelength range and with built-in 220-4900 nm polarisers at PHOTONEX this year. Book your demonstration with us if you are interested.
The PHOTON RT has been specifically designed to be used by optical coaters to measure their coatings. It does not require any additional accessories to make its measurements with the exception of a polarization beam splitting cube holder.
Some Key Features:
Lambda’s demonstration 4” QPZ offers a bit more to users over the standard workhorse VeriFire XPZ system. Top of the list is the QPSI acquisition capability which allows the QPZ to acquire measurements in moderate vibration environments such as production floor metrology systems. This combined with a 1k x 1k camera and high power, long life stabilised He/Ne laser make for a production friendly tool. Add in the new Mx Software with many intuitive measurements set-up configurations and reporting as well as the familiar and simple QFAS (Quick Fringe Acquisition System) and you have a very useful measurement system.
We also have a range of accessories to work with our 4” QPZ including Transmission Flats (4% and DynaFlect), 2 Axis Mount, f/0.75 Transmission Spheres, 5 axis Mount and Reference Spheres.
Zygo Nexview 3D Optical Surface Profiler
The Nexview is the Zygo flagship optical profiler sporting all you should need to measure most surfaces with light microscopy lateral resolution. The Nexview can measure surfaces from super-smooth to very rough, with sub-nanometer precision that is independent of field of view.
Measure:
- Super-smooth surfaces using SmartPSI technology – simple and fast
- Steep sloped surfaces
- Steps and troughs
- Large areas by field stitching
- Thin transparent films
- Surfaces in colour
- Gauge capable – Reproducible and Repeatable results
- Mx Software – 3D plots, slices, ISO 25178 surface measurement parameters
- Regions – isolate and analyse individual regions within a measurement field of view
Savvy Optics SavvyInspector SIF-4
We have the SIF-4 system at Lambda. The SavvyInspector performs an objective measurement of scratch and dig visibility.
The instrument is designed specifically to reproduce the conditions of an in-reflection visual inspection described in Appendix C of MIL-PRF-13830B, “General specification governing the manufacture, assembly, and inspection of optical components for fire control instruments.”
The SavvyInspector™ SIF-4 uses a 0.5 megapixel camera for standard surface imperfection measurements on flat optics such as windows, filters, mirrors, gratings, and prisms. ISO mode is supported to a grade 0.063 or larger for general and coating imperfections (but not L-type imperfections).
A higher resolution system is available and there is also a new motorised system which has just been released. Fully automated systems may be possible for large volume applications.
Essent Optics PHOTON RT UV-VIS-MWIR Spectrophotometers
We will have a PHOTON RT Spectrophotometer with 190-4900 nm wavelength range and with built-in 220-4900 nm polarisers at PHOTONEX this year. Book your demonstration with us if you are interested.
The PHOTON RT has been specifically designed to be used by optical coaters to measure their coatings. It does not require any additional accessories to make its measurements with the exception of a polarization beam splitting cube holder.
Some Key Features:
- Build-in broadband high-contrast polarisers covering 220-4900 nm wavelength range
- Unique polariser configuration: S, P, S+P+(S+P)/2, random and user-defined S:P ratio for incident beam
- Absolute specular reflectance measurement (R, Rs, Rp) for 8-75 deg AOI
- Transmittance measurement (T, Ts, Tp) for 0-75 deg AOI
- Built-in beam displacement compensation for angular transmittance measurement of thick samples at high angles
- Unattended batch measurements of single and multiple samples
- Determination of complex refractive index and layer thickness (n.k.d. parameters) for single-layer homogeneous coatings
- Small footprint, (420W х 610D х 270H) mm