18 November 2010
The Metricon 2010/M Prism Coupler’s key ability is to rapidly and accurately measure both the thickness and the refractive index/birefringence of dielectric and polymer films. The Model 2010/M offers unique advantages over conventional instruments based on ellipsometry or spectrophotometry.
For thin films in the range of 0.5 microns to >15 microns:
- It has a routine index accuracy of ±.0005, resolution of ±.0003 (accuracy of up to ±.0001, resolution ±.00005 achievable for many applications)
- It is completely general - no advance knowledge of thickness, index, or material type required
- It is applicable to a wide range of application areas - measures thin films on higher or lower index substrates, free standing flexible polymer films, waveguides, Surface Plasmon Resonance (SPR) structures
- It can provide rapid characterization of thin film or diffused optical waveguides including waveguide loss
For bulk materials and now liquids, using the new Liquid Cell Option:
- It can provide high accuracy determination of dispersion (index vs wavelength) and measure Abbe number.
- It can measure refractive index/birefringence measurement of bulk materials, including flexible polymers and now liquids.
For more information on the Metricon 2010/M Prism Coupler and Liquid Cell Option click here. To request further information by email click here or call:
Ken Middleton on 01582 764334