Beehive 100D EMC Probe
The Beehive Electronics 100D is a small, handheld magnetic field probe ideal for locating the sources of EMC emissions. Its integrated electrostatic shield offers good common-mode rejection, and its fine spatial resolution make it easy to track a source of emissions down to the offending component.
- An integrated electrostatic shield in the loop probes eliminates common-mode pickup
- Multiple loop sizes offer optimum sensitivity and spatial resolution at different frequencies
- Probe dimensions optimized for access to tight spaces
- Calibrated sensitivity up to 3 GHz, depending on model. Usable to beyond 6 GHz
- Can be driven by a signal source to generate fields for electromagnetic susceptibility testing
The Beehive 100 series EMC probes are designed for identifying and fixing EMC problems. The loop probes have integrated electrostatic shields, providing isolation from commonmode signals. As a result, these probes deliver excellent repeatability. The different probe shapes and loop sizes allow the user to select the optimum probe for a given frequency, providing the optimum sensitivity and spatial resolution.
The 100D stub probe, with its narrow tip, offers the highest spatial resolution. It is ideally suited to tasks such as tracking EMC sources down to the individual pins of an IC. Because of the planar construction of the probes, even the large loops are only 0.11” thick, allowing the probe to be inserted into narrow seams and gaps.
Beehive Electronics 100 Series EMC Probe Datasheet 
